LSI Test
To become a trusted silicon partner for customers, we believe that it is not only simply providing superior manufacturing capabilities, but also ensuring superior quality through testing.
Our test support covers all kinds of tests from low price to high price SoCs.
Optimized according to the characteristics evaluation and product specifications, we can help you achieve efficient evaluation in a short period of time.
Furthermore, we offer multi-site and concurrent tests to reduce costs in the mass production stage. In addition, based on thorough characterization, we can reduce redundant test items in wafer and package tests, minimizes test time without compromising measurement quality, and contributes to customer cost reduction.
Alchip’s test program and jig development flow is divided into five steps to ensure that our customers receive the highest quality products.
Select the best tester
Test program development results with ADVANTEST (including former Verigy), TERADYNE and LTX-Credence.
We own a tester (V93K) in a test house which can be used in the design stage.
Design and manufacture of test jig
We have bounty experience in designing and manufacturing jigs such as probe cards, load boards, sockets and change kits.
Pattern conversion
We support various formats such as STIL, WGL and VCD, and can quickly convert over 500 pattern files.
Test program development
In-house test programs are developed based on development results from basic logic tests, such as SCAN, Memory BIST, JTAG, etc., to high-speed interface tests, such as DDR, PCIe, USB, SATA, LVDS, and analog tests, such as ADC, DAC, RF, etc.
In addition, since detailed simulation is performed when designing jigs, debugging in a short period of time is made possible.
Characterization
Finally, we will evaluate characteristics such as voltage and timing margin.
LSI Test
To become a trusted silicon partner for customers, we believe that it is not only simply providing superior manufacturing capabilities, but also ensuring superior quality through testing.
Our test support covers all kinds of tests from low price to high price SoCs.
Optimized according to the characteristics evaluation and product specifications, we can help you achieve efficient evaluation in a short period of time.
Furthermore, we offer multi-site and concurrent tests to reduce costs in the mass production stage. In addition, based on thorough characterization, we can reduce redundant test items in wafer and package tests, minimizes test time without compromising measurement quality, and contributes to customer cost reduction.
Alchip’s test program and jig development flow is divided into five steps to ensure that our customers receive the highest quality products.
Select the best tester
Test program development results with ADVANTEST (including former Verigy), TERADYNE and LTX-Credence.
We own a tester (V93K) in a test house which can be used in the design stage.
Design and manufacture of test jig
We have bounty experience in designing and manufacturing jigs such as probe cards, load boards, sockets and change kits.
Pattern conversion
We support various formats such as STIL, WGL and VCD, and can quickly convert over 500 pattern files.
Test program development
In-house test programs are developed based on development results from basic logic tests, such as SCAN, Memory BIST, JTAG, etc., to high-speed interface tests, such as DDR, PCIe, USB, SATA, LVDS, and analog tests, such as ADC, DAC, RF, etc.
In addition, since detailed simulation is performed when designing jigs, debugging in a short period of time is made possible.
Characterization
Finally, we will evaluate characteristics such as voltage and timing margin.
